Correction: Structural, electrical, and optical properties of NiO films for surface-enhanced Raman spectroscopy applications
Long Nguyen Hoang, Le Huu Bao, Tran Le
TL;DR
This paper corrects a previously published study on NiO films for Raman spectroscopy applications.
Contribution
The paper provides corrections to prior findings on the properties of NiO films for SERS.
Findings
The original study's findings on NiO film properties were corrected.
Structural, electrical, and optical properties were re-evaluated.
The corrections aim to improve accuracy for SERS applications.
Abstract
Correction for ‘Structural, electrical, and optical properties of NiO films for surface-enhanced Raman spectroscopy applications’ by Long Nguyen Hoang et al., RSC Adv., 2025, 15, 17365–17376, https://doi.org/10.1039/D5RA02866C.
Genes, proteins, chemicals, diseases, species, mutations and cell lines named across the full text — each resolved to its canonical identifier and authoritative record.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsGas Sensing Nanomaterials and Sensors · Advanced Nanomaterials in Catalysis