# Correction: Structural, electrical, and optical properties of NiO films for surface-enhanced Raman spectroscopy applications

## TL;DR

This paper corrects a previously published study on NiO films for Raman spectroscopy applications.

## Contribution

The paper provides corrections to prior findings on the properties of NiO films for SERS.

## Key findings

- The original study's findings on NiO film properties were corrected.
- Structural, electrical, and optical properties were re-evaluated.
- The corrections aim to improve accuracy for SERS applications.

## Abstract

Correction for ‘Structural, electrical, and optical properties of NiO films for surface-enhanced Raman spectroscopy applications’ by Long Nguyen Hoang et al., RSC Adv., 2025, 15, 17365–17376, https://doi.org/10.1039/D5RA02866C.