Correction: AFM-IR investigation of thin PECVD SiOx films on a polypropylene substrate in the surface-sensitive mode
Hendrik Müller, Hartmut Stadler, Teresa de los Arcos, Adrian Keller, Guido Grundmeier
Abstract
Genes, proteins, chemicals, diseases, species, mutations and cell lines named across the full text — each resolved to its canonical identifier and authoritative record.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAnalytical Chemistry and Sensors · Smart Materials for Construction · Surface Roughness and Optical Measurements
The authors regret that the acknowledgement in the publication is unfortunately not complete.
The following sentence in the Funding section is missing: This work was supported by the German Research Foundation (DFG) under grant number 407752136 and North Rhine-Westphalia based on the funding for large appliances (AFM-IR).
The complete funding section should read: