# Correction: AFM-IR investigation of thin PECVD SiOx films on a polypropylene substrate in the surface-sensitive mode

**Authors:** Hendrik Müller, Hartmut Stadler, Teresa de los Arcos, Adrian Keller, Guido Grundmeier

PMC · DOI: 10.3762/bjnano.16.19 · Beilstein Journal of Nanotechnology · 2025-02-20

## Full-text entities

- **Chemicals:** SiO x (-), polypropylene (MESH:D011126)

## Full text

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Source: https://tomesphere.com/paper/PMC11863405