PMC · DOI:10.1186/s11671-024-03968-z·February 12, 2024
Correction: Switching performance assessment of gate-all-around InAs–Si vertical TFET with triple metal gate, a simulation study
Dariush Madadi, Saeed Mohammadi
Abstract
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Taxonomy
TopicsAdvancements in Semiconductor Devices and Circuit Design · Nanowire Synthesis and Applications · Semiconductor materials and devices