X-ray diffraction analysis to support phase identification in FeSe and Fe$_7$Se$_8$ epitaxial thin films

TL;DR

This paper uses X-ray diffraction to analyze epitaxial FeSe and Fe7Se8 thin films, revealing their phase composition, orientations, and structural details, aiding in phase identification and understanding of growth conditions.

Contribution

It provides detailed XRD analysis of FeSe and Fe7Se8 thin films, including phase orientations and structural properties, supporting phase identification in epitaxial iron selenide films.

Findings

FeSe and Fe7Se8 phases are present in double epitaxy

Fe7Se8 exhibits two different epitaxial orientations

XRD data verifies phase orientations and mosaic structure

Abstract

X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented. The films contain ${\beta}$-FeSe and Fe$_7$Se$_8$ phases in a double epitaxy configuration with the ${\beta}$-FeSe phase (001) oriented on the (001) MgO growth substrate. Fe$_7$Se$_8$ simultaneously takes on two different epitaxial orientations in certain growth conditions, exhibiting both (101)- and (001)- orientations. Each of these orientations are verified with the presented XRD data. Additionally, XRD data used to determine the PLD target composition as well as mosaic structure of the ${\beta}$-FeSe phase are shown.