# X-ray diffraction analysis to support phase identification in FeSe and Fe$_7$Se$_8$ epitaxial thin films

## TL;DR

This paper uses X-ray diffraction to analyze epitaxial FeSe and Fe7Se8 thin films, revealing their phase composition, orientations, and structural details, aiding in phase identification and understanding of growth conditions.

## Contribution

It provides detailed XRD analysis of FeSe and Fe7Se8 thin films, including phase orientations and structural properties, supporting phase identification in epitaxial iron selenide films.

## Key findings

- FeSe and Fe7Se8 phases are present in double epitaxy
- Fe7Se8 exhibits two different epitaxial orientations
- XRD data verifies phase orientations and mosaic structure

## Abstract

X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented. The films contain ${\beta}$-FeSe and Fe$_7$Se$_8$ phases in a double epitaxy configuration with the ${\beta}$-FeSe phase (001) oriented on the (001) MgO growth substrate. Fe$_7$Se$_8$ simultaneously takes on two different epitaxial orientations in certain growth conditions, exhibiting both (101)- and (001)- orientations. Each of these orientations are verified with the presented XRD data. Additionally, XRD data used to determine the PLD target composition as well as mosaic structure of the ${\beta}$-FeSe phase are shown.

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Source: https://tomesphere.com/paper/1901.09794