On Optical Properties Of Ion Beams Extracted From Electron Cyclotron Resonance Ion Source

TL;DR

This paper simulates ion extraction from an Electron Cyclotron Resonance Ion Source, analyzing beam profiles and aberrations caused by plasma shape, and reproduces hollow beam features under various focusing conditions.

Contribution

It introduces a simulation approach combining plasma surface modeling and ion tracing to analyze ion beam properties from ECRIS.

Findings

Beam profiles exhibit strong aberrations due to plasma meniscus shape.

Hollow beam features are successfully reproduced in simulations.

Profiles change with different focusing conditions.

Abstract

Ion extraction from DECRIS-PM source is simulated by using initial distributions of ions at the extraction aperture obtained with NAM-ECRIS code. Three-dimensional calculations of plasma emissive surface are done and ions are traced in the extraction region. The ion beam profiles show strong aberrations due to shape of plasma meniscus; hollow beam features are reproduced, as well as changes in profiles for different focusing conditions.