# On Optical Properties Of Ion Beams Extracted From Electron Cyclotron Resonance Ion Source

## TL;DR

This paper simulates ion extraction from an Electron Cyclotron Resonance Ion Source, analyzing beam profiles and aberrations caused by plasma shape, and reproduces hollow beam features under various focusing conditions.

## Contribution

It introduces a simulation approach combining plasma surface modeling and ion tracing to analyze ion beam properties from ECRIS.

## Key findings

- Beam profiles exhibit strong aberrations due to plasma meniscus shape.
- Hollow beam features are successfully reproduced in simulations.
- Profiles change with different focusing conditions.

## Abstract

Ion extraction from DECRIS-PM source is simulated by using initial distributions of ions at the extraction aperture obtained with NAM-ECRIS code. Three-dimensional calculations of plasma emissive surface are done and ions are traced in the extraction region. The ion beam profiles show strong aberrations due to shape of plasma meniscus; hollow beam features are reproduced, as well as changes in profiles for different focusing conditions.

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Source: https://tomesphere.com/paper/1706.07583