Standardization of Proton Induced X-Ray Emission for Analysis of Trace Elements in Thick Targets

TL;DR

This study standardizes the PIXE technique for trace element analysis in thick samples, using reference materials and comparing experimental results with theoretical data to ensure accuracy.

Contribution

It introduces a standardized PIXE methodology for analyzing trace elements in thick samples, validated through comparison with theoretical data.

Findings

Experimental data closely matches theoretical predictions.

Effective use of SRMs for calibration in PIXE analysis.

Validated methodology for trace element detection in thick targets.

Abstract

This paper presents the standardization of Proton Induced X-rays Emission (PIXE) technique for the trace element analysis of thick standard samples. Three standard reference materials (SRMs) viz-\`a-vis titanium, copper and iron base alloys were used for the study due to their availability. The protons beam was accelerated up to 2.57 MeV energy by 5UDH-II tandem Pelletron accelerator and samples were irradiated at different geometry and durations. Spectrum was acquired using a multi-channel spectrum analyzer while spectrum analysis was done using a GUPIXWIN model for determination of elemental concentrations of trace elements. The obtained experimental data was compared with theoretical data and results were found in close agreement.