# Standardization of Proton Induced X-Ray Emission for Analysis of Trace Elements in Thick Targets

## TL;DR

This study standardizes the PIXE technique for trace element analysis in thick samples, using reference materials and comparing experimental results with theoretical data to ensure accuracy.

## Contribution

It introduces a standardized PIXE methodology for analyzing trace elements in thick samples, validated through comparison with theoretical data.

## Key findings

- Experimental data closely matches theoretical predictions.
- Effective use of SRMs for calibration in PIXE analysis.
- Validated methodology for trace element detection in thick targets.

## Abstract

This paper presents the standardization of Proton Induced X-rays Emission (PIXE) technique for the trace element analysis of thick standard samples. Three standard reference materials (SRMs) viz-\`a-vis titanium, copper and iron base alloys were used for the study due to their availability. The protons beam was accelerated up to 2.57 MeV energy by 5UDH-II tandem Pelletron accelerator and samples were irradiated at different geometry and durations. Spectrum was acquired using a multi-channel spectrum analyzer while spectrum analysis was done using a GUPIXWIN model for determination of elemental concentrations of trace elements. The obtained experimental data was compared with theoretical data and results were found in close agreement.

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Source: https://tomesphere.com/paper/1703.04532