Statistical Optics approach to the design of beamlines for Synchrotron Radiation
Gianluca Geloni, Evgeni Saldin, Evgeni Schneidmiller, Mikhail, Yurkov

TL;DR
This paper develops a rigorous statistical optics framework to analyze and design beamlines for synchrotron radiation, explicitly calculating coherence properties and image formation considering electron beam emittance and optical system imperfections.
Contribution
It introduces a method to compute the cross-spectral density of undulator sources and propagates it through optical systems, addressing limitations of Gaussian models for X-ray coherence.
Findings
Explicit calculation of undulator source coherence properties.
Reduction of complex integrals to analytical convolutions.
Analysis of aberrations and aperture effects on image formation.
Abstract
In this paper we analyze the image formation problem for undulator radiation through an optical system, accounting for the influence of the electron beam emittance. On the one hand, image formation with Synchrotron Radiation is governed by the laws of Statistical Optics. On the other hand, the widely used Gaussian-Shell model cannot be applied to describe the coherence properties of X-ray beams from third generation Synchrotron Radiation sources. As a result, a more rigorous analysis of coherence properties is required. We propose a technique to explicitly calculate the cross-spectral density of an undulator source, that we subsequently propagate through an optical imaging system. At first we focus on the case of an ideal lens with a non-limiting pupil aperture. Our theory, which makes consistent use of dimensionless analysis, also allows treatment and physical understanding of many…
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Particle Accelerators and Free-Electron Lasers · Adaptive optics and wavefront sensing
