Understanding transverse coherence properties of X-ray beams in third generation Synchrotron Radiation sources
Gianluca Geloni (1), Evgeni Saldin (1), Evgeni Schneidmiller (1) and, Mikhail Yurkov (1) ((1) Deutsches Elektronen-Synchrotron (DESY), Hamburg,, Germany)

TL;DR
This paper develops a comprehensive theory for the transverse coherence of X-ray undulator radiation, providing practical formulas and methods to accurately predict and manipulate coherence properties in third-generation synchrotron sources.
Contribution
It introduces a general technique to calculate the cross-spectral density of undulator radiation beyond the quasi-homogeneous approximation, improving coherence predictions for beamline design.
Findings
Derived an analytical expression for the cross-spectral density up to the undulator exit.
Provided simple formulas for transverse coherence length applicable to various sources.
Demonstrated manipulation of coherence properties using a vertical slit to enlarge the coherent spot.
Abstract
This paper describes a theory of transverse coherence properties of Undulator Radiation. Our study is of very practical relevance, because it yields specific predictions of Undulator Radiation cross-spectral density in various parts of the beamline. On the contrary, usual estimations of coherence properties assume that the undulator source is quasi-homogeneous, like thermal sources, and rely on the application of van Cittert-Zernike (VCZ) theorem, in its original or generalized form, for calculating transverse coherence length in the far-field approximation. The VCZ theorem is derived in the frame of Statistical Optics using a number of restrictive assumptions: in particular, the quasi-homogeneous assumption is demonstrated to be inaccurate in many practical situations regarding undulator sources. We propose a technique to calculate the cross-spectral density from undulator sources in…
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Particle Accelerators and Free-Electron Lasers · Advanced Electron Microscopy Techniques and Applications
