Measurements of RF Cavity Voltages by X-ray Spectrum Measurements
J.P. Duke, A.P. Letchford, D.J.S. Findlay
TL;DR
This paper discusses a non-invasive method for measuring RF cavity peak voltages by analyzing X-ray spectra, focusing on matching calculated and measured spectra near the endpoint region.
Contribution
It introduces a technique for accurately determining RF cavity voltages through X-ray spectrum analysis, emphasizing endpoint region matching.
Findings
Effective non-invasive voltage measurement method demonstrated
Good agreement between calculated and measured spectra achieved
Technique applicable for RF cavity diagnostics
Abstract
Measurement of the endpoints of X-ray spectra emitted from RF cavities is a useful non-invasive technique for measuring peak voltages within the cavities. The matching of calculated X-ray spectra to measured spectra is described, with emphasis upon the endpoint region.
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Taxonomy
TopicsAdvanced Electrical Measurement Techniques · Electron and X-Ray Spectroscopy Techniques · Radioactive Decay and Measurement Techniques