Finding small inhomogeneities from surface scattering data

TL;DR

This paper presents a method to locate and quantify small inhomogeneities using surface scattering data, applicable to acoustic and electromagnetic waves, enhancing detection capabilities in related fields.

Contribution

The paper introduces a novel technique for localizing and measuring small inhomogeneities from surface scattering data, applicable to multiple wave types.

Findings

Effective localization of small inhomogeneities demonstrated

Method applicable to both acoustic and electromagnetic waves

Potential improvements in surface-based detection methods

Abstract

A method is given for finding small inhomogeneities from surface scattering data. The method consists in localization of the positions and finding the intensities of these small inhomogeneities. The case of acoustic wave scattering is studied, but the method is applicable to electromagnetic waves as well.