Correlations of a bound interface over a random substrate
Jo\"el De Coninck, Fran\c{c}ois Dunlop, Thierry Huillet

TL;DR
This study uses Monte-Carlo simulations to analyze the correlation function of a one-dimensional interface over a random substrate, revealing a specific exponential decay form with a variable exponent influenced by interface tension.
Contribution
It provides a detailed numerical characterization of the height correlation function and its dependence on interface tension, which was not previously well understood.
Findings
Correlation function fits exp(-(j/b)^c) form
Exponent c varies from 1.0 to 1.5 with tension
High-precision fit across full correlation range
Abstract
The correlation function of a one-dimensional interface over a random substrate, bound to the substrate by a pressure term, is studied by Monte-Carlo simulation. It is found that the height correlation < h_i ; h_{i+j} >, averaged over the substrate disorder, fits a form exp(-(j/b)^c) to a surprising precision in the full range of j where the correlation is non-negligible. The exponent c increases from 1.0 to 1.5 when the interface tension is taken larger and larger.
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