Precision measurements of the total and partial widths of the psi(2S) charmonium meson with a new complementary-scan technique in antiproton-proton annihilations
Fermilab E835 Collaboration: M. Andreotti, S. Bagnasco, W. Baldini, D., Bettoni, G. Borreani, A. Buzzo, R. Calabrese, R. Cester, G. Cibinetto, P., Dalpiaz, G. Garzoglio, K. E. Gollwitzer, M. Graham, M. Hu, D. Joffe, J., Kasper, G. Lasio, M. Lo Vetere, E. Luppi, M. Macr\`i

TL;DR
This paper reports highly precise measurements of the psi(2S) charmonium meson's total and partial widths using a novel complementary-scan technique in antiproton-proton annihilations, improving the accuracy of resonance parameters.
Contribution
A new complementary-scan method was developed for studying narrow resonances, reducing dependence on machine lattice parameters and enhancing measurement precision.
Findings
Measured psi(2S) total width as 290 ± 25(stat) ± 4(sys) keV.
Determined the partial width product as 579 ± 38(stat) ± 36(sys) meV.
Achieved the most precise resonance width measurements to date.
Abstract
We present new precision measurements of the psi(2S) total and partial widths from excitation curves obtained in antiproton-proton annihilations by Fermilab experiment E835 at the Antiproton Accumulator in the year 2000. A new technique of complementary scans was developed to study narrow resonances with stochastically cooled antiproton beams. The technique relies on precise revolution-frequency and orbit-length measurements, while making the analysis of the excitation curve almost independent of machine lattice parameters. We study the psi(2S) meson through the processes pbar p -> e+ e- and pbar p -> J/psi + X -> e+ e- + X. We measure the width to be Gamma = 290 +- 25(sta) +- 4(sys) keV and the combination of partial widths Gamma_e+e- * Gamma_pbarp / Gamma = 579 +- 38(sta) +- 36(sys) meV, which represent the most precise measurements to date.
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Taxonomy
TopicsAtomic and Molecular Physics · X-ray Spectroscopy and Fluorescence Analysis · Mass Spectrometry Techniques and Applications
