Beam Test of Silicon Strip Sensors for the ZEUS Micro Vertex Detector

TL;DR

This paper reports on extensive beam tests of silicon strip sensors for the ZEUS Micro Vertex Detector, evaluating their performance, resolution, and simulation accuracy for the HERA upgrade.

Contribution

It presents a comprehensive testing setup and results for irradiated and non-irradiated sensors, including performance analysis with different algorithms and geometries.

Findings

Sensors achieved high position resolution with various algorithms.

Good agreement between measurements and Monte Carlo simulations.

Performance maintained after irradiation, suitable for HERA upgrade.

Abstract

For the HERA upgrade, the ZEUS experiment has designed and installed a high precision Micro Vertex Detector (MVD) using single sided micro-strip sensors with capacitive charge division. The sensors have a readout pitch of 120 microns, with five intermediate strips (20 micron strip pitch). An extensive test program has been carried out at the DESY-II testbeam facility. In this paper we describe the setup developed to test the ZEUS MVD sensors and the results obtained on both irradiated and non-irradiated single sided micro-strip detectors with rectangular and trapezoidal geometries. The performances of the sensors coupled to the readout electronics (HELIX chip, version 2.2) have been studied in detail, achieving a good description by a Monte Carlo simulation. Measurements of the position resolution as a function of the angle of incidence are presented, focusing in particular on the comparison between standard and newly developed reconstruction algorithms.