ElectroOptical measurements of ultrashort 45 MeV electron beam bunch
D. Nikas (1), V. Castillo (1), L. Kowalski (2), R. Larsen (1), D. M., Lazarus(1), C. Ozben(1), Y. K. Semertzidis(1), T. Tsang(1), T., Srinivasan-Rao(1). ((1) Brookhaven National Laboratory) ((2) Montclair State, University)
TL;DR
This paper demonstrates the use of electro-optical techniques to non-destructively measure ultrashort 45 MeV electron beam bunches, achieving femtosecond resolution and revealing details about bunch charge and structure.
Contribution
It introduces an electro-optical method for high-resolution, non-destructive measurement of relativistic electron bunches, including ionization effects.
Findings
EO modulation amplitude increases linearly with beam charge
Signal risetime limited to ~70 ps by detection system
Ionization effects observed in EO crystal
Abstract
We have made an observation of 45 MeV electron beam bunches using the nondestructive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with the optical beam path distance from the electron beam. The risetime of the signal was bandwidth limited by our detection system to \~70ps. An EO signal due to ionization caused by the electrons traversing the EO crystal was also observed. The EO technique may be ideal for the measurement of bunch structure with femtosecond resolution of relativistic charged particle beam bunches.
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