Beam Test Results of the BTeV Silicon Pixel Detector
G. Chiodini, J.A. Appel, M. Artuso, J.N. Butler, G. Cardoso, H., Cheung, D.C. Christian, A. Colautti, R. Coluccia, M. Di Corato, E.E., Gottschalk, B.K. Hall, J. Hoff, P. A. Kasper, R. Kutschke, S.W. Kwan, A., Mekkaoui, D. Menasce, C. Newsom, S. Sala, R. Yarema, J.C. Wang
TL;DR
This paper reports on the beam test results of the BTeV silicon pixel detector, analyzing its spatial resolution under various conditions such as track angle, sensor bias, and readout threshold.
Contribution
It provides experimental data on the performance of the BTeV silicon pixel detector, including how its resolution varies with different operational parameters.
Findings
Spatial resolution depends on track inclination.
Sensor bias and readout threshold significantly affect detector performance.
Beam test results validate the detector design for future use.
Abstract
The results of the BTeV silicon pixel detector beam test carried out at Fermilab in 1999-2000 are reported. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold.
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Taxonomy
TopicsParticle Detector Development and Performance · Radiation Detection and Scintillator Technologies · Photocathodes and Microchannel Plates