The DELPHI Silicon Tracker in the global pattern recognition
Markus Elsing

TL;DR
This paper reviews the development and implementation of the DELPHI Silicon Tracker's pattern recognition algorithms, highlighting upgrades and performance improvements over a decade of LEP data collection.
Contribution
It presents the final algorithms and concepts for track reconstruction using the DELPHI Silicon Tracker, reflecting advancements tailored to evolving experimental needs.
Findings
Successful track reconstruction with silicon tracker data
Enhanced pattern recognition algorithms for improved tracking
Adaptations for different LEP operational phases
Abstract
ALEPH and DELPHI were the first experiments operating a silicon vertex detector at LEP. During the past 10 years of data taking the DELPHI Silicon Tracker was upgraded three times to follow the different tracking requirements for LEP 1 and LEP 2 as well as to improve the tracking performance. Several steps in the development of the pattern recognition software were done in order to understand and fully exploit the silicon tracker information. This article gives an overview of the final algorithms and concepts of the track reconstruction using the Silicon Tracker in DELPHI.
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