Measurements of critical current diffraction patterns in annular Josephson junctions

TL;DR

This paper presents systematic experimental measurements of the critical current diffraction patterns in annular Josephson junctions across a broad magnetic field range, revealing modulation effects dependent on junction width and aligning well with theoretical predictions.

Contribution

It provides new experimental data on critical current patterns in annular Josephson junctions and compares these results with existing theoretical models.

Findings

Modulation of the diffraction pattern envelope depends on junction width

Good agreement between experimental data and theoretical predictions

Broad magnetic field range measurements conducted

Abstract

We report systematic measurements of the critical current versus magnetic field patterns of annular Josephson junctions in a wide magnetic field range. A modulation of the envelope of the pattern, which depends on the junction width, is observed. The data are compared with theory and good agreement is found.