Scanned Potential Microscopy of Edge States in a Quantum Hall Liquid
Michael T. Woodside, Chris Vale, Kent L. McCormick, Paul L. McEuen, C., Kadow, K.D. Maranowski, A.C. Gossard

TL;DR
This paper employs a low-temperature atomic force microscope to measure local voltage profiles in a quantum Hall system, revealing sharp edge voltage drops that are affected by edge state re-equilibration.
Contribution
It introduces a novel scanning potential microscopy technique to directly observe edge state behavior in quantum Hall liquids.
Findings
Sharp voltage drops at sample edges observed
Re-equilibration suppresses voltage drops
Edge state dynamics are directly visualized
Abstract
Using a low-temperature atomic force microscope as a local voltmeter, we measure the Hall voltage profile in a quantum Hall conductor in the presence of a gate-induced non-equilibrium edge state population at n=3. We observe sharp voltage drops at the sample edges which are suppressed by re-equilibrating the edge states.
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