X-Ray Diffraction from Pinned Charge Density Waves
S.Rouziere, S.Ravy, S.Brazovskii, J.-P.Pouget

TL;DR
This paper uses x-ray diffraction to investigate how impurities affect charge density waves in doped materials, revealing interference effects, asymmetries, and Friedel oscillations around defects.
Contribution
It provides the first direct x-ray evidence of Friedel oscillations around impurities in doped charge density wave systems.
Findings
Asymmetry between +2k_f and -2k_f satellite reflections observed.
Friedel oscillations detected around impurity atoms.
Impurity pinning influences charge density wave profiles.
Abstract
We present an x-ray study of doped charge density waves systems. When a 2k_f-charge density wave is strongly pinned to impurities, an interference effect gives rise to an asymmetry between the intensities of the +2k_f and -2k_f satellite reflections. Moreover, profile asymmetry of the satellite reflections indicates the existence of Friedel oscillations (FOs) around the defects. We have studied these effects in V- and W-doped blue bronzes. A syncrotron radiation study of the V-doped blue bronze clearly reveals the presence of FO around the V atoms.
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