Voltage-biased I-V characteristics in the multi-Josephson junction model of high T$_c$ superconductor
S.Sakamoto, H.Matsumoto, T.Koyama, and M.Machida

TL;DR
This paper explores the complex voltage-current behavior in multi-Josephson junctions of high T$_c$ superconductors, revealing characteristic regions and oscillations caused by inter-layer couplings, which could confirm the underlying coupling mechanisms.
Contribution
It introduces a detailed analysis of I-V characteristics in multi-Josephson junctions, highlighting the effects of inter-layer coupling on the nonlinear behavior.
Findings
Identification of three characteristic regions in I-V curves
Discovery of chaotic behavior in intermediate voltage range
Observation of multi-branch structure at high voltages
Abstract
By use of the multi-Josephson junction model, we investigate voltage-biased I-V characteristics. Differently from the case of the single junction, I-V characteristics show a complicated behavior due to inter-layer couplings among superconducting phase differences mediated by the charging effect. We show that there exist three characteristic regions, which are identified by jumps and cusps in the I-V curve. In the low voltage region, the total current is periodic with trigonometric functional increases and rapid drops. Then a kind of chaotic region is followed. Above certain voltage, the total current behaves with a simple harmonic oscillation and the I-V characteristics form a multi-branch structure as in the current-biased case. The above behavior is the result of the inter-layer coupling, and may be used to confirm the inter-layer coupling mechanism of the formation of hysteresis…
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