Glass transitions and dynamics in thin polymer films: dielectric relaxation of thin films of polystyrene
Koji Fukao, Yoshihisa Miyamoto

TL;DR
This study investigates how the glass transition temperature and dielectric relaxation behavior of polystyrene thin films vary with film thickness, revealing a critical thickness where dynamics change significantly.
Contribution
It provides a detailed analysis of the thickness dependence of $T_{g}$, $T_{ m extalpha}$, and relaxation time distributions in polystyrene films, highlighting the role of a critical thickness $d_{c}$.
Findings
$T_{g}$ decreases with decreasing film thickness.
$T_{ extalpha}$ remains constant above $d_{c}$ and decreases below.
Relaxation time distribution broadens as thickness decreases.
Abstract
The glass transition temperature and the temperature corresponding to the peak in the dielectric loss due to the -process have been simultaneously determined as functions of film thickness d through dielectric measurements for polystyrene thin films supported on glass substrate. The dielectric loss peaks have also been investigated as functions of frequency for a given temperature. A decrease in was observed with decreasing film thickness, while was found to remain almost constant for and to decrease drastically with decreasing d for . Here, is a critical thickness dependent on molecular weight. The relaxation time of the -process was found to have a d dependence similar to that of . The relaxation function for the -process was obtained by using the observed…
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