A low-temperature dynamic mode scanning force microscope operating in high magnetic fields

TL;DR

This paper presents a low-temperature, high-magnetic-field scanning force microscope using piezoelectric tuning forks and phase-locked loop control, enabling advanced probe techniques at cryogenic conditions.

Contribution

It introduces a novel low-temperature, high-field SFM setup with fast response and non-optical tip control, suitable for diverse scanning probe applications.

Findings

Operates below 4.2K and in magnetic fields up to 8T

Uses piezoelectric tuning forks for tip-sample distance control

Employs phase-locked loop for rapid response

Abstract

A scanning force microscope was implemented operating at temperatures below 4.2K and in magnetic fields up to 8T. Piezoelectric quartz tuning forks were employed for non optical tip-sample distance control in the dynamic operation mode. Fast response was achieved by using a phase-locked loop for driving the mechanical oscillator. Possible applications of this setup for various scanning probe techniques are discussed.