Frequency-Dependent Shot Noise as a Probe of Electron-Electron Interaction in Mesoscopic Diffusive Contacts

TL;DR

This paper numerically investigates how frequency-dependent shot noise in mesoscopic diffusive contacts reveals electron-electron interaction strength, showing that noise increases with frequency and can be used to measure interaction parameters.

Contribution

It provides a numerical analysis of shot noise behavior under strong electron-electron scattering at zero temperature, linking noise characteristics to interaction parameters.

Findings

Noise increases with frequency and approaches finite values.

Limiting noise values exceed Poissonian noise levels.

Noise scales nearly as voltage to the power 4/3.

Abstract

The frequency-dependent shot noise in long and narrow mesoscopic diffusive contacts is numerically calculated. The case of arbitrarily strong electron-electron scattering and zero temperature of electrodes is considered. For all voltages, the noise increases with frequency and tends to finite values. These limiting values are larger than the Poissonian noise and increase nearly as voltage to power 4/3. This allows one to experimentally determine the parameters of electron-electron interaction.