Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions

TL;DR

This paper presents a near-field scanning microwave microscopy technique capable of measuring local microwave properties and electric field distributions at sub-wavelength scales, enabling detailed analysis of microwave devices.

Contribution

It introduces a versatile microwave microscopy method that can quantitatively analyze either material properties or local electric fields at small scales.

Findings

Successful measurement of local microwave properties.

Quantitative mapping of electric field distributions.

Enhanced resolution beyond traditional microwave imaging.

Abstract

We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two possible configurations, allowing a quantitative study of either material properties or local electric fields.