Resistivity due to low-symmetrical defects in metals
J.P. Dekker, A. Lodder, J. van Ek (Amsterdam, The Netherlands)

TL;DR
This paper presents an ab initio calculation of impurity resistivity caused by low-symmetrical defects in metals, using multiple-scattering theory and Boltzmann equation solutions for FCC and BCC metals.
Contribution
It introduces a method to compute residual resistivity due to specific defect types in metals from first principles.
Findings
Resistivity due to impurity-vacancy pairs calculated for Al, Ag, and V.
Method combines multiple-scattering theory with iterative Boltzmann equation solutions.
Provides insights into the origin of 1/f noise related to defect motion.
Abstract
The impurity resistivity, also known as the residual resistivity, is calculated ab initio using multiple-scattering theory. The mean-free path is calculated by solving the Boltzmann equation iteratively. The resistivity due to low-symmetrical defects, such as an impurity-vacancy pair, is calculated for the FCC host metals Al and Ag and the BCC transition metal V. Commonly, 1/f noise is attributed to the motion of such defects in a diffusion process.
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