Spin Tunneling in Conducting Oxides
Alexander Bratkovsky (HP Labs, Palo Alto)

TL;DR
This paper analyzes various tunneling mechanisms in ferromagnetic junctions, highlighting how surface states, defects, and inelastic processes like magnons and phonons influence tunneling magnetoresistance (TMR) and its bias dependence.
Contribution
It provides a comprehensive theoretical model comparing direct, impurity-assisted, surface state, and inelastic tunneling contributions to TMR, with specific focus on half-metallic systems.
Findings
Direct tunneling accounts for about 30% resistance change in iron systems.
Surface polarized states can significantly increase TMR values.
Resonant defect states decrease TMR to around 4%, while resonant tunnel diodes yield about 8%.
Abstract
Direct tunneling in ferromagnetic junctions is compared with impurity-assisted, surface state assisted, and inelastic contributions to a tunneling magnetoresistance (TMR). Theoretically calculated direct tunneling in iron group systems leads to about a 30% change in resistance, which is close to experimentally observed values. It is shown that the larger observed values of the TMR might be a result of tunneling involving surface polarized states. We find that tunneling via resonant defect states in the barrier radically decreases the TMR (down to 4% with Fe-based electrodes), and a resonant tunnel diode structure would give a TMR of about 8%. With regards to inelastic tunneling, magnons and phonons exhibit opposite effects: one-magnon emission generally results in spin mixing and, consequently, reduces the TMR, whereas phonons are shown to enhance the TMR. The inclusion of both magnons…
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