Dopant Spatial Distributions: Sample Independent Response Function And Maximum Entropy Reconstruction

TL;DR

This paper introduces a maximum entropy deconvolution method to accurately reconstruct boron spatial distributions from SIMS data, improving depth resolution and revealing boron segregation.

Contribution

It presents a novel sample independent response function method and applies maximum entropy deconvolution to enhance SIMS depth profile analysis.

Findings

Reconstructed boron distributions agree across different primary ion energies.

Depth resolution is significantly improved in reconstructed data.

Boron segregation near the surface is clearly observed.

Abstract

We demonstrate the use of maximum entropy based deconvolution to reconstruct boron spatial distribution from the secondary ion mass spectrometry (SIMS) depth profiles on a system of variously spaced boron $\delta$-layers grown in silicon. Sample independent response functions are obtained using a new method which reduces the danger of incorporating real sample behaviour in the response. Although the original profiles of different primary ion energies appear quite differently, the reconstructed distributions agree well with each other. The depth resolution in the reconstructed data is increased significantly and segregation of boron at the near surface side of the $\delta$-layers is clearly shown.