Distribution of Transmitted Charge through an Ultrasmall Double-Tunnel Junction

TL;DR

This paper models charge transmission through an ultrasmall double junction considering Coulomb effects at zero temperature, deriving a recursive equation for transmission probability and comparing it to non-charging cases.

Contribution

It introduces a recursive equation for charge transmission probability in ultrasmall double junctions with Coulomb effects, advancing understanding of quantum charge transport.

Findings

Recursive relation for transmission probability derived

Coulomb effects significantly influence charge transmission

Comparison shows differences from non-charging double junctions

Abstract

The transmission of charge through an ultrasmall double junction is considered with Coulomb effects but at zero temperature. We construct an equation which describes the time development of the transmission probability of charges and solve this equation in terms of a recursion relation. The results are compared with the double junction without charging effects.