Electronic transport in a series of multiple arbitrary tunnel junctions

TL;DR

This paper presents Monte Carlo simulations and an analytical semiclassical model to analyze Coulomb blockade and single-electron effects in series of multiple tunnel junctions, providing formulas for Coulomb gaps and differential conductivity.

Contribution

It introduces a combined simulation and analytical approach to quantify Coulomb effects in series tunnel junctions, including explicit formulas relating Coulomb gaps to capacitances.

Findings

Coulomb gap expressed as a simple function of capacitances.

Differential conductivity at current onset calculated.

Results depend on the number of junctions.

Abstract

Monte Carlo simulations and an analytical approach within the framework of a semiclassical model are presented which permit the determination of Coulomb blockade and single electron charging effects for multiple tunnel junctions coupled in series. The Coulomb gap in the I(V) curves can be expressed as a simple function of the capacitances in the series. Furthermore, the magnitude of the differential conductivity at current onset is calculated in terms of the model. The results are discussed with respect to the number of junctions.