Double-tip STM for Surface Analysis

TL;DR

This paper investigates the use of a double-tip STM to analyze surface electronic properties, enabling detailed measurements of Green functions, scattering, transport regimes, and inelastic processes at the atomic scale.

Contribution

It introduces a novel application of double-tip STM for probing electronic Green functions and related surface phenomena, expanding the capabilities of surface analysis techniques.

Findings

Demonstrates the feasibility of using double-tip STM for Green function measurements

Provides methods to analyze scattering phase shifts and transport regimes

Shows potential for detailed inelastic mean free path measurements

Abstract

We explore the possibility of using a double-tip STM to probe the single electron Green function of a sample surface, and describe a few important applications: (1) Probing constant energy surfaces in $\k$-space by ballistic transport; (2) Measuring scattering phase shifts of defects; (3) Observing the transition from ballistic to diffusive transport to localization; and (4) Measuring inelastic mean free paths.