X-ray Absorption Fine Structure in Embedded Atoms
J.J. Rehr, C.H. Booth, F. Bridges, S. I. Zabinsky

TL;DR
This paper identifies and confirms a new oscillatory feature in X-ray absorption spectra caused by scattering within embedded atoms, offering a novel method to probe chemical bonding and exchange effects.
Contribution
It introduces the concept of atomic-XAFS (AXAFS), demonstrating its existence through calculations and measurements, and highlights its significance in understanding chemical and electronic interactions.
Findings
AXAFS arises from scattering within embedded atoms
AXAFS can dominate multi-electron excitation contributions
AXAFS is sensitive to chemical effects
Abstract
Oscillatory structure is found in the atomic background absorption in x-ray-absorption fine structure (XAFS). This atomic-XAFS or AXAFS arises from scattering within an embedded atom, and is analogous to the Ramsauer-Townsend effect. Calculations and measurements confirm the existence of AXAFS and show that it can dominate contributions such as multi-electron excitations. The structure is sensitive to chemical effects and thus provides a new probe of bonding and exchange effects on the scattering potential.
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