Impact of the tip radius on the lateral resolution in piezoresponse force microscopy

TL;DR

This study quantitatively examines how tip radius, sample type, and thickness influence lateral resolution in piezoresponse force microscopy, achieving a record resolution of 17 nm with a 15 nm tip radius.

Contribution

It demonstrates a linear relationship between tip radius and domain wall width and validates the independence of lateral resolution from crystal type.

Findings

Lateral resolution linearly depends on tip radius.

Highest lateral resolution of 17 nm achieved with a 15 nm tip.

Lateral resolution is independent of crystal type.

Abstract

We present a quantitative investigation of the impact of tip radius as well as sample type and thickness on the lateral resolution in piezoresponse force microscopy (PFM) investigating bulk single crystals. The observed linear dependence of the width of the domain wall on the tip radius as well as the independence of the lateral resolution on the specific crystal-type are validated by a simple theoretical model. Using a Ti-Pt-coated tip with a nominal radius of 15 nm the so far highest lateral resolution in bulk crystals of only 17 nm was obtained.