Rietveld refinement of ZrSiO4: application of a phenomenological model of anisotropic peak width
A. Sarkar, P. Mukherjee, P. Barat
TL;DR
This paper applies Stephens's phenomenological model to analyze anisotropic peak broadening in ZrSiO4, estimating microstructural parameters like domain size and dislocation density through variance analysis.
Contribution
It introduces a novel application of a phenomenological model to characterize anisotropic broadening in ZrSiO4 and estimates microstructural parameters.
Findings
Successful modeling of anisotropic peak broadening
Quantitative estimates of domain size and dislocation density
Visualization of strain distribution in ZrSiO4
Abstract
The anisotropic broadening of ZrSiO4 sample is modelled using the Stephens's phenomenological model for anisotropic line broadening and the three dimensional strain distribution in the sample is plotted. The micro-structural parameters like domain size and dislocation density are estimated using the variance method.
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Taxonomy
TopicsX-ray Diffraction in Crystallography · Microstructure and mechanical properties · Microstructure and Mechanical Properties of Steels