Use of real-time Fourier Transform Infrared Reflectivity as an in situ monitor of YBCO film growth and processing

TL;DR

This paper demonstrates the use of real-time FTIR spectroscopy as an effective in situ tool to monitor the growth and processing of YBCO films, revealing phase transitions and growth pathways.

Contribution

It introduces FTIR as a novel in situ monitoring technique for YBCO film deposition, providing real-time insights into phase evolution and growth dynamics.

Findings

FTIR detects insulating phases with distinct reflectivity fingerprints.

Reflectivity fingerprints correlate with temperature and oxygen pressure.

FTIR reveals kinetic and thermodynamic pathways during YBCO growth.

Abstract

Fourier Transform Infrared (FTIR) spectroscopy has been utilized during high rate E-beam evaporation/deposition of YBa2Cu3O7 (YBCO). The results demonstrate the great utility of FTIR as an in situ monitor of YBCO deposition and processing. We detect different (amorphous/fine polycrystalline) insulating pre-existing phases to the high Tc superconducting phase which appear to have distinct reflectivity fingerprints dominated by thin film interference effects, as a function of temperature and oxygen pressure. These fingerprints reveal some of the kinetic and thermodynamic pathways during the growth of YBCO.