(In,Ga)As gated-vertical quantum dot with an Al2O3 insulator
Tomohiro Kita, Daichi Chiba, Yuzo Ohno, and Hideo Ohno

TL;DR
This paper reports the fabrication and low-temperature electrical characterization of a gated-vertical (In,Ga)As quantum dot with an Al2O3 insulator, demonstrating controlled electron occupancy and Coulomb blockade effects.
Contribution
It introduces a novel gated-vertical quantum dot structure with an Al2O3 insulator fabricated via atomic layer deposition, enabling precise electron control.
Findings
Clear Coulomb diamonds observed at 1.1K
Electron number in the quantum dot controlled from 0 to ~130
Successful integration of Al2O3 insulator for gate control
Abstract
We fabricated a gated-vertical (In,Ga)As quantum dot with an Al2O3 gate insulator deposited using atomic layer deposition and investigated its electrical transport properties at low temperatures. The gate voltage dependence of the dI/dV-V characteristics shows clear Coulomb diamonds at 1.1K. The metal-insulator gate structure allowed us to control the number of electrons in the quantum dot from 0 to a large number estimated to be about 130.
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Taxonomy
TopicsSemiconductor materials and devices · Electronic and Structural Properties of Oxides · Surface and Thin Film Phenomena
