Double Gate Bias Dependency of Low Temperature Conductivity of SiO2-Si-SiO2 Quantum Wells
M. Prunnila, J.M. Kivioja, J. Ahopelto

TL;DR
This study investigates how gate bias influences the conductivity of SiO2-Si-SiO2 quantum wells at low temperatures, revealing non-monotonic behavior linked to sub-band effects and wave function delocalization.
Contribution
It provides new insights into the gate bias dependence of conductivity in quantum wells, highlighting the role of well thickness and sub-band phenomena.
Findings
Conductivity shows strong non-monotonic features in thicker wells.
A minimum in conductivity occurs near the second sub-band threshold.
Wave function delocalization affects conductivity at high electron densities.
Abstract
The gate bias dependency of conductivity is examined in two Si quantum wells with well thickness tw = 7 nm and tw = 14 nm. The conductivity of the thinner device behaves smoothly whereas the thicker device shows strong non-monotonic features as a function of gate voltages. We show that a strong minimum in conductivity occurs close to the threshold of second sub-band. Another minimum is seen at high electron density at symmetric well potential. This feature is addressed to sub-band wave function delocalization in the quantization direction.
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