Evidence of defect phase formation in solid Xe induced by synchrotron radiation

TL;DR

This paper reports the first observation of defect phase formation in solid xenon caused by synchrotron radiation, using luminescence intensity changes over time as evidence.

Contribution

It introduces a novel experimental approach to detect defect phases in solid Xe induced by synchrotron radiation.

Findings

Detection of defect phase formation in solid Xe

Use of luminescence intensity as a time-dependent indicator

First experimental evidence of this phenomenon

Abstract

The growing of defect phase in solid Xe induced by synchrotron radiation is observed for the first time using the dependence of intensity on time of characteristic intrinsic luminescence band.