Hybrid reciprocal space for X-ray diffraction in epitaxic layers

TL;DR

This paper develops a comprehensive theory for hybrid reciprocal space in epitaxic layers, revealing complex geometries and properties that enhance X-ray diffraction analysis beyond traditional superpositions.

Contribution

It introduces a general theoretical framework for hybrid reflections in reciprocal space, improving understanding and analysis of epitaxic layer/substrate systems.

Findings

Reveals complex hybrid reciprocal space geometries

Enables detailed analysis with conventional X-ray diffractometers

Provides insights into properties of layer/substrate systems

Abstract

Even after several decades of systematic usage of X-ray diffraction as one of the major analytical tool for epitaxic layers, the vision of the reciprocal space of these materials is still a simple superposition of two reciprocal lattices, one from the substrate and another from the layer. In this work, the general theory accounting for hybrid reflections in the reciprocal space of layer/substrate systems is presented. It allows insight into the non-trivial geometry of such reciprocal space as well as into many of its interesting properties. Such properties can be further exploited even on conventional-source X-ray diffractometers, leading to alternative, very detailed, and comprehensive analysis of such materials.