Pitfalls on the determination of the universality class of radial clusters
S. C. Ferreira Jr., S. G. Alves

TL;DR
This study reveals that the measured growth exponent of radial clusters depends on the choice of origin for interface width calculation, highlighting a potential pitfall in classifying universality classes of such systems.
Contribution
The paper demonstrates how the evaluation of the growth exponent varies with the origin choice, clarifying discrepancies in previous measurements and emphasizing the importance of fluctuation scales.
Findings
The growth exponent depends on the origin used for interface width measurement.
Using the initial seed yields the KPZ exponent of 1/3.
Border CM fluctuations grow faster than interface fluctuations.
Abstract
The self-affinity of growing systems with radial symmetry, from tumors to grain-grain displacement, has devoted increasing interest in the last decade. In this work, we analyzed features about the interface scaling of these clusters through large scale simulations (up to particles) of two-dimensional growth processes with special emphasis on the off-lattice Eden model. The central objective is to discuss an important pitfall associated to the evaluation of the growth exponent of these systems. We show that the value depends on the choice of the origin used to determine the interface width. We considered two strategies frequently used. When the width is evaluated in relation to the center of mass (CM) of the border, the exponent obtained for the Eden model was , in very good agreement with previous reported values. However, if the…
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