Study of the Magnetic Film Materials by Horizontal Scanning Mode for the Magnetic Force Microscopy in Magnetostatic and ac Regimes
Artorix de la Cruz de Ona, Nibaldo Alvarez Moraga

TL;DR
This paper introduces a method to determine the magnetic permeability of layered magnetic films using horizontal scanning magnetic force microscopy data, employing the Hankel transform inverse method for both static and ac regimes.
Contribution
It presents a novel inverse problem approach for magnetic permeability recovery in layered films using the Hankel transform method in MFM.
Findings
Successful application of the HIM to layered slab films.
Feasibility of recovering magnetic permeability from experimental data.
Extension of the inverse problem to ac MFM regimes.
Abstract
The magnetic force microscopy inverse problem for the case of horizontal scanning of a tip on a linear magnetic film is introduced. We show the possibility to recover the magnetic permeability of the material from the experimental data by using the Hankel (Fourier-Bessel) transform inverse method (HIM). This method is applied to the case of a layered slab film as well. The inverse problem related to the ac MFM is introduced.
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Taxonomy
TopicsCharacterization and Applications of Magnetic Nanoparticles · Magnetic Properties and Applications · Magnetic properties of thin films
