AC Josephson effect and resonant Cooper pair tunneling emission of a Cooper Pair Transistor
P.-M. Billangeon, F. Pierre, H. Bouchiat, R. Deblock

TL;DR
This paper reports on high-frequency emission measurements of a single Cooper pair transistor, demonstrating the AC Josephson effect and resonant tunneling phenomena through photon-assisted tunneling detection.
Contribution
It introduces a novel on-chip measurement technique for directly detecting the AC Josephson effect in a Cooper pair transistor.
Findings
Direct detection of the AC Josephson effect in a SCPT
Observation of Landau-Zener transitions with gate voltage
Analysis of resonant Cooper pair tunneling emission
Abstract
We measure the high-frequency emission of a single Cooper pair transistor(SCPT) in the regime where transport is only due to tunneling of Cooper pairs. This is achieved by coupling on-chip the SCPT to a superconductor-insulator-superconductor junction and by measuring the photon assisted tunneling current of quasiparticles across the junction. This technique allows a direct detection of the AC Josephson effect of the SCPT and provides evidence of Landau-Zener transitions for proper gate voltage. The emission in the regime of resonant Cooper pair tunneling is also investigated. It is interpreted in terms of transitions between charge states coupled by the Josephson effect.
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