Height and roughness distributions in thin films with Kardar-Parisi-Zhang scaling
Thereza Paiva, F. D. A. Aarao Reis

TL;DR
This study analyzes height and roughness distributions in thin films modeled by KPZ dynamics, finding that roughness distributions are more reliable indicators of KPZ scaling than height distributions, especially in finite-size systems.
Contribution
It provides detailed measurements of height and roughness distributions in KPZ models, highlighting the robustness of roughness distributions for identifying KPZ scaling in experimental conditions.
Findings
Height distributions show finite-size effects and limited accuracy.
Roughness distributions exhibit good data collapse and characteristic KPZ features.
Roughness distributions are more reliable than height distributions for testing KPZ scaling.
Abstract
We study height and roughness distributions of films grown with discrete Kardar-Parisi-Zhang (KPZ) models in a small time regime which is expected to parallel the typical experimental conditions. Those distributions are measured with square windows of sizes gliding through a much larger surface. Results for models with weak finite-size corrections indicate that the absolute value of the skewness and the value of the kurtosis of height distributions converge to and , respectively. Despite the low accuracy of these results, they give additional support to a recent claim of KPZ scaling in oligomer films. However, there are significant finite-size effects in the scaled height distributions of models with large local slopes, such as ballistic deposition, which suggests that comparison of height distributions must not be used to rule…
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