A Scanning Electron Microscope for Ultracold Atoms
T. Gericke, C. Utfeld, N. Hommerstad, H. Ott

TL;DR
This paper introduces a novel scanning electron microscopy technique for detecting and imaging single atoms in ultracold quantum gases with high spatial resolution, enabling advanced in situ atomic measurements.
Contribution
It presents a new electron impact ionization method for ultracold atom detection, offering improved spatial resolution over optical methods and potential for site-specific addressing.
Findings
High spatial resolution detection of single atoms
Capability for in situ measurements of atomic correlations
Potential for addressing individual lattice sites
Abstract
We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focussed electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atoms position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices.
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