Incident-energy and polarization dependent RIXS study of La2CuO4

TL;DR

This study uses Cu K-edge RIXS to analyze charge excitations in La2CuO4, revealing polarization-dependent features and the role of 4p electrons, advancing understanding of electronic structure in cuprates.

Contribution

It provides a detailed polarization-dependent RIXS analysis of La2CuO4, highlighting the influence of 4p electrons and charge-transfer processes, with theoretical insights into resonance mechanisms.

Findings

Weakly-dispersive electron-hole excitations observed

Similar fine structures for different polarizations suggest core hole effects

Two charge-transfer features near 2 eV with polarization dependence

Abstract

We present a detailed Cu K-edge resonant inelastic X-ray scattering (RIXS) study of the Mott insulator La2CuO4 in the 1-7 eV energy transfer range. As initially found for the high-temperature superconductor HgBa2CuO4+d, the spectra exhibit a multiplet of weakly-dispersive electron-hole excitations, which are revealed by utilizing the subtle dependence of the cross section on the incident photon energy. The close similarity between the fine structures for in-plane and out-of-plane polarizations is indicative of the central role played by the 1s core hole in inducing charge excitations within the CuO2 planes. On the other hand, we observe a polarization dependence of the spectral weight, and careful analysis reveals two separate features near 2 eV that may be related to different charge-transfer processes. The polarization dependence indicates that the 4p electrons contribute significantly to the RIXS cross section. Third-order perturbation arguments and a shake-up of valence excitations are then applied to account for the final-energy resonance in the spectra. As an alternative scenario, we discuss fluorescence-like emission processes due to 1s -> 4p transitions into a narrow continuum 4p band.