Propagation of edge magnetoplasmons in semiconductor quantum-well structures

TL;DR

This paper provides a theoretical analysis of edge magnetoplasmon propagation in semiconductor quantum-well structures, focusing on wavelength and length variations to aid in optimizing quantum-well microwave spectrometers at liquid-nitrogen temperatures.

Contribution

It offers a detailed theoretical study of edge magnetoplasmon behavior in quantum-well structures, linking physical parameters to propagation characteristics for device optimization.

Findings

Wavelength and propagation length depend on frequency, magnetic field, and electron density.

Results facilitate analysis and optimization of quantum-well microwave spectrometers.

The study supports the design of devices operating at liquid-nitrogen temperatures.

Abstract

The wavelength and the propagation length of the edge magnetoplasmons, running along the edge of a two-dimensional electron layer in a semiconductor quantum-well structure are theoretically studied as a function of frequency, magnetic field, electron density, mobility, and geometry of the structure. The results are intended to be used for analysis and optimization of operation of recently invented quantum-well microwave spectrometers operating at liquid-nitrogen temperatures (I. V. Kukushkin {\em et al}, Appl. Phys. Lett. {\bf 86}, 044101 (2005)).